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Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance by Leonhard Hennen, Julia Hahn, Miltos Ladikas, Ralf Lindner, Walter Peissl, Rinie van Est

by Leonhard Hennen, Julia Hahn, Miltos Ladikas, Ralf Lindner, Walter Peissl, Rinie van Est

ISBN 13: 9783031106194

Format: Paperback (284 pages)
Publisher: Springer
Published: 08 Jan 2023


New : $42.26

New : $42.26

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